SMSI 2023 Conference Program

09:20 Greeting

09:30 Digital Future of Metrology

Frank Härtig, Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)

10:15 Sensor and Data Systems for Circular Materials – R&D Demands and Requirements for Interface Specifications and for Validated Applications

Bernd Valeske, Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren, Saarbrücken (Germany)

11:30 A1.1 - Towards a structural foundation of a quality infrastructure in the digital world

J. Niederhausen, S. Eichstädt, H. Hansen, Physikalisch-Technische Bundesanstalt, Berlin (Germany)

12:00 A1.2 - Digital Testing Platform for Artificial Intelligence: A modular and scalable concept

M. Liebl, S. Eichstädt, D. Hutzschenreuter, A. Kofler, C. Kolbitsch, F. Härtig, Physikalisch-Technische Bundesanstalt, Berlin (Germany)

12:20 A1.3 - 37 - Digital Transformation of Processing Metrological Services

C. Kulka-Peschke, S. Eickelberg, A. Keidel, M. Meiborg, A. Oppermann, Physikalisch-Technische Bundesanstalt, Berlin (Germany)

12:40 A1.4 - A Cloud Native Architecture for automated Metrological Services

A. Oppermann, S. Eickelberg, A. Keidel, C. Kulka-Peschke, M. Meiborg, Physikalisch-Technische Bundesanstalt, Berlin (Germany)

11:30 B1.1 - Chemo/Biosensing with Optical Fibres

F. Baldini, Istituto di Fisica Applicata “Nello Carrara”, CNR, Sesto Fiorentino (Italy)

12:00 B1.2 - Colorimetric Detection of Oxygen in Food Packaging

L. Engel, K. Schmitt, J. Wöllenstein, University of Freiburg, Freiburg (Germany)

12:20 B1.3 - CMOS Based Integration Technology for Solid State pH-Measurement

O. Hild, F. Al-Falahi, C. Beale, C. Kunath, E. Kurth, Fraunhofer IPMS, Dresden (Germany)

12:40 B1.4 - Development of Simple, Reusable and Sensitive Electrochemical Sensor based on Silver Nanoparticles Modified Gold Screen-Printed Electrode for the Detection of Nitrate in Water

N. Ben Messaoud, M. dos Santos, R. Queirós, B. Espiña, International Iberian Nanotechnology Laboratory, Braga (Portugal)

11:30 C1.1 - One-Step Traceability with NIST on a Chip

J. Hendricks, National Institute of Standards, Gaithersburg (USA)

12:00 C1.2 - Rydberg Atoms for One-Step Traceability for

A. Artusio-Glimpse, National Institute of Standards, Gaithersburg (USA)

12:20 C1.3 - Integrated Nanophotonics for One-Step Traceability for Temperature Measurements

N. Klimov, National Institute of Standards, Gaithersburg (USA)

12:40 C1.4 - Using the Kibble Principle for One-Step Traceability for Mass, Force, and Torque

S. Schlamminger, National Institute of Standards, Gaithersburg (USA)

11:30 D1.1 - Magnetic sensors for process control of forming processes

J. Vasquez, Frank Walther, Technical University of Dortmund, Dortmund (Germany), B. Arian, W. Homberg, University of Paderborn, Paderborn (Germany), L. Kersting, A. Trächtler, Fraunhofer Institute for Mechatronic Systems Design, Paderborn (Germany)

12:00 D1.2 - Sensitivity Analysis of Barkhausen Noise Measurements for Residual Stress Correlation

S. Stebner, M. Dölz, S. Münstermann, RWTH Aachen University, Aachen (Germany), A. Ismail, B. Lohmann, D. Maier, W. Volk, Technical University of Munich, München (Germany)

12:20 D1.3 - Real-Time Microstructure Characterization using Eddy Current-based Soft Sensors

S. Hütter, T. Halle, G. Mook, Otto-von-Guericke Universität, Magdeburg (Germany)

12:40 D1.4 - Multifrequency Multichannel Eddy Current Sensor System for the Analysis of Mechanical States in Ferromagnetic Materials

F. Wendler, B. Awiszus, O. Kanoun, R. Laue, Chemnitz University of Technology, Chemnitz (Germany), S. Härtel, Brandenburg University of Technology, Cottbus (Germany)

14:00 A2.1 - NDE Sensors for Traceability by Material Fingerprints

K. Jacob, Fraunhofer IZFP, Saarbrücken (Germany)

14:30 A2.2 - Non-destructive inline sensors for digital material twin in the carbon fiber tape laying process

J. Oswald, J. Summa, C. Jungmann, D. Koster, U. Rabe, Fraunhofer IZFP, Saarbrücken (Germany)

14:50 A2.3 - Information recycling of NDE data sets

F. Leinenbach, B. Sprau, C. Stumm, Fraunhofer IZFP, Saarbrücken (Germany)

15:10 A2.4 - Deep Learning-Assisted Optimal Sensor Placement in Ultrasound NDT

H. Wang, E. Pérez, F. Römer, Fraunhofer IZFP, Saarbrücken (Germany)

14:00 B2.1 - Concepts and applications of QT, including quantum-referenced sensing and relevance for QComputing & Qcommunication

N. Spethmann, Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)

14:30 B2.2 - Nitrogen-Vacancy Centers for Quantum Sensing

N. Aslam, Technische Universität Braunschweig, Braunschweig (Germany)

14:50 B2.3 - Magnetometry (quantum [OPM] and classic) for battery cells for electromobility

G. Kendall, CDO2 Ltd., Brighton (United Kingdom)

15:10 B2.4 - Integrated quantum sensors based on atomic gases

M. Krutzik, Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Berlin (Germany)

14:00 C2.1 - Measurement Science in Psychology: Prospects for New SI Units

W. Fisher, University of California (USA)

14:30 C2.2 - Development of a conductive MEMS-SPM for nanoelectrical characterisation of nanostructured materials

Z. Li, U. Brand, C. Kuhlmann, Physikalisch-Technische Bundesanstalt, Braunschweig (Germany), K. Kaja, F. Piquemal, Laboratoire national de métrologie et d’essais, Trappes Cedex (France), S. Hahn, K. Hiller, Technical University of Chemnitz, Chemnitz (Germ

14:50 C2.3 - Optical Metrology for the Characterization of Fluids Relevant for Hydrogen Storage and Transport

M. Kerscher, A. Fröba, J. Jander, T. Koller, M. Piszko, M. Rausch, P. Schmidt, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen (Germany), P. Wasserscheid, Forschungszentrum Jülich GmbH, Erlangen (Germany)

15:10 C2.4 - Trust Metrology – A label to ackowledge good pratices in metrology

J. Lopez, Collège Français de Metrologie, Paris (France), S. Denaës, Colas, Paris (France)

14:00 D2.1 - New developments in mathematics for metrology: Virtual experiments, machine learning and synthetic reference data

M. Baer, Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)

14:30 D2.2 - Advanced error modelling of a Fourier scatterometer

M. van Dijk, G. Kok, VSL - Narional Metrology Institute, Delft (Netherlands)

14:50 D2.3 - Modelling in Measurement - From classical analytical approaches to cognitive data-driven solutions -

N. Schiering, ZMK & ANALYTIK GmbH, Bitterfeld-Wolfen, (Germany), M. Heizmann Karlsruhe Institute of Technology, Karlsruhe (Germany), W. Koch, Fraunhofer FKIE, Wachtberg (Germany), K.-D. Sommer, Technische Universität Ilmenau, Ilmenau (Germany)

15:10 D2.4 - On uncertainty evaluation using virtual experiments

G. Wübbeler, M. Marschall, C. Elster, Physikalisch-Technische Bundesanstalt, Berlin (Germany)