Plenary Talk 2 - From Sensors to Standards: How NIST on a Chip is Transforming International Metrology
- Event
- SMSI 2021
2021-05-03 - 2021-05-06
digital - Band
- SMSI 2021
- Chapter
- SMSI 2021 - Plenary Talks
- Author(s)
- B. Goldstein - NIST - National Institute of Standards and Technology, Gaithersburg (USA)
- Pages
- 27 - 28
- DOI
- 10.5162/SMSI2021/PT2
- ISBN
- 978-3-9819376-4-0
- Price
- free
Abstract
What draws the line between a sensor and a standard? If precision measurement devices can be reduced to the size of a grain of rice, embedded directly in products, deployed on submarines or satellites without the need for periodic calibration, how does the international metrology ramework need to change to adapt? And what commercial applications does it enable? These are the very questions raised by the successes of the NIST on a Chip program, which is transforming how precision measurements are being brought out of the lab and deployed at point of use through a suite of miniaturized, fit-for-purpose, quantum-based traceable sensors.