| SMSI 2020 |
P4.3 - 6 DoF Pose Estimation with ìm/ìrad Accuracy Based on Laser Multilateration |
J. Nitsche, M. Franke, D. Heißelmann - Physikalisch-Technische Bundesanstalt, Braunschweig (Germany), N. Haverkamp - Carl Zeiss Industrielle Messtechnik, Oberkochen (Germany) |
| SMSI 2020 |
P4.4 Estimate the error of offset issue and amplitude mismatch of Atan2 function |
J. Zhou, M. Dietrich, P. Walden - Schaeffler Automotive Buehl GmbH & Co. KG, Bühl (Germany), J. Kolb - Schaeffler Technologies AG & Co. KG, Karlsruhe (Germany), M. Doppelbauer - Karlsruhe Institute of Technology, Karlsruhe (Germany) |
| SMSI 2020 |
P4.5 Linear Regression Method for Measuring Characteristics of the ADC on Harmonic Test Signals |
S. Sherstobitov, M. Karpova - All-Russian Scientific Research Institute of Physicotechnical and Radio Engineering Measurements(VNIIFTRI), Moscow region (Russia) |
| SMSI 2020 |
P4.6 Mathematical Measures for Calibration and Evaluation of Gas Sensor Data |
R. Seifert - HybridSensorNet, Karlsruhe (Germany), H. Keller - Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen (Germany) |
| SMSI 2020 |
P4.7 Expanded Uncertainty Evaluation Taking into Account the Correlation Between Estimates of Input Quantities |
P. Neyezhmakov, I. Zakharov - National Scientific Centre “Institute of Metrology”, Kharkiv (Ukraine), O. Botsiura - Kharkiv National University of Radioelectronics, Kharkiv (Ukraine) |
| SMSI 2020 |
E1.1 Innovative mass standards for the worldwide transfer of the redefined unit kilogram |
K. Lehrmann, D. Knopf, F. Härtig - Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany) |
| SMSI 2020 |
E1.2 SI Realization of the farad at LNE |
A. Imanaliev, O. Thevenot, K. Dougdag, F. Piquemal - LNE, Trappes (France) |
| SMSI 2020 |
E1.3 Studies on the Use of Bandgap References as a Voltage Standard |
B. Schumacher, C. Rohrig - Physikalisch-Technische Bundesanstalt, Braunschweig (Germany), G. Weckwerth - wekomm engineering GmbH, Planegg (Germany) |
| SMSI 2020 |
E1.4 Photonic Thermometry at PTB – Challenges and Perspectives for Contact Temperature Metrology Utilizing Optical Sensors |
S. Krenek, R. Eisermann, S. Rudtsch - Physikalisch-Technische Bundesanstalt, Berlin (Germany), G. Winzer - Leibniz-Institut für innovative Mikroelektronik, Frankfurt/Oder (Germany), T. Habisreuther - Leibniz-Institut für Photonische Technologien, Jena (Germany) |
| SMSI 2020 |
E2.1 Introduction “Future Topics in Metrology” |
S. Eichstädt - Physikalisch-Technische Bundesanstalt, Berlin (Germany) |