Available documents

Event	Title	Author(s)
SMSI 2020	Plenary Talk 1 - Measurement and Sensor Technology in the Digital Transformation Process	U. Kaiser - Endress+Hauser Group Services AG, Reinach (Switzerland)
SMSI 2020	Plenary Talk 2 - NIST on a Chip: Revolutionizing metrology through deployable, quantum-based sensors	B. Goldstein - National Institute of Standards and Technology
SMSI 2020	Plenary Talk 3 - Realising the Redefined Kelvin	Machin - National Physical Laboratory (NPL), Teddington (Great Britain)
SMSI 2020	Plenary Talk 4 - NIST on a Chip: Photonic and Quantum-Based Sensors for Measurements of Pressure, Vacuum, Temperature and Beyond!	J. Hendricks, Z. Ahmed, D. Barker, K. Douglass, S. Eckel, J. Fedchak, N. Klimov, J. Ricker, J. Scherschligt - NIST – National Institute of Standards and Technology, Gaithersburg (USA)
SMSI 2020	Plenary Talk 5 - Measurements beyond the SI: On the Longstanding ExistencP of Metrology-ready Precision Quantities in psychology and the Social Sciences	W. Fisher - University of California, Berkeley (USA)