B3.2 Compensating the Quantitative Signal of Metal Oxide Semi-conductor Gas Sensors in Temperature Cycled Operation under the Influence of Siloxane Poisoning
- Event
- SMSI 2021
2021-05-03 - 2021-05-06
digital - Band
- SMSI 2021 - Sensors and Instrumentation
- Chapter
- B3 Gas Sensors III
- Author(s)
- C. Schultealbert, T. Baur, T. Sauerwald, A. Schütze - Saarland University, Saarbrücken (Germany)
- Pages
- 119 - 120
- DOI
- 10.5162/SMSI2021/B3.2
- ISBN
- 978-3-9819376-4-0
- Price
- free
Abstract
We present a method for quantifying the degradation state due to siloxane poisoning of a metal oxide semiconductor gas sensor using temperature cycled operation. The time constant for the generation of surface charge at high temperature increases through poisoning and is only slightly dependent on the gas atmosphere. In addition to indicating a necessary sensor replacement, this signal can also be used for drift compensation based on the relation between sensor signal and this time constant.