| SENSOR+TEST Conferences 2009 |
O4.1 - First results in the IR and THz spectral range at the Metrology Light Source |
R. Mueller, A. Bawagan, A. Hoehl, R. Klein, G. Ulm - Physikalisch-Technische Bundesanstalt, Berlin, Germany, J. Feikes, M. v. Hartrott, U. Schade, G. Wuestefeld - BESSY GmbH, Berlin, Germany |
| SENSOR+TEST Conferences 2009 |
O4.2 - Thin-Film Measurements with Short Pulse Terahertz Radiation |
J. Jonuscheit, F. Ellrich, M. Theuer, G. Torosyan, R. Beigang - Fraunhofer Institut für Physikalische Messtechnik IPM, Kaiserslautern, Germany |
| SENSOR+TEST Conferences 2009 |
O4.3 - Interpretation of Imaging Techniques of Photovoltaic Modules Assisted by Temperature Simulation |
C. Buerhop - Bavarian Center for Applied Energy Research (ZAE Bayern), Erlangen, Germany |
| SENSOR+TEST Conferences 2009 |
O4.4 - Relibility Analysis of Indicator Functions in an Automated Multiscale Measuring System |
A. Burla, J. Regin, W. Lyda, J. Zimmermann, W. Osten, E. Westkaemper, O. Sawodny - Universität Stuttgart, Stuttgart, Germany |
