| AMA Conferences 2013 |
1.2 - Line Sensor for Fast, Time-Resolved Spectroscopy Measurements |
E. Poklonskaya, D. Durini, M. Jung, O. Schrey, W. Brockherde - Fraunhofer IMS, Duisburg (Germany) |
| AMA Conferences 2013 |
1.3 - Actuation Principles for Hybrid Two-Dimensional Quasistatic Micro Scanning Mirrors |
S. Kimme, T. Sandner, A. Graf, U. Todt - Fraunhofer IPMS, Dresden (Germany), J. Czarske - Technische Universität Dresden (Germany) |
| AMA Conferences 2013 |
1.4 - Quasi-static Microscanner with Linearized Scanning for an adaptive 3D-Lasercamera |
T. Sandner, T. Grasshoff, M. Schwarzenberg, H. Schenk - Fraunhofer Institute for Photonic Microsystems (IPMS), Dresden (Germany) |
| AMA Conferences 2013 |
2.1 - A Method to Remotely Measure Amplitudes of Surface Vibrations with a Conventional Michelson Interferometer |
R. Hohenstein, F. Tenner, C. Brock, M. Schmidt - Friedrich-Alexander-University of Erlangen-Nuremberg (Germany) |
| AMA Conferences 2013 |
2.2 - Optical twist measurement by scatterometry |
A. Hertzsch, K. Kröger, M. Großmann - INNOVENT Technology Development, Jena (Germany) |
| AMA Conferences 2013 |
2.3 - Precise shape measurements of rotating workpieces by a single optical sensor |
R. Kuschmierz, P. Günther, J. Czarske - Technische Universität Dresden (Germany) |
| AMA Conferences 2013 |
3.1 - Optimization of the illumination optics for gap flow velocity measurements in turbo machines |
R. Schlüßler, C. Blechschmidt, A. Fischer, J. Czarske - Technische Universität Dresden (Germany) |
| AMA Conferences 2013 |
3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture |
C. Hoof, D. Wetzlar, B. Henning - University of Paderborn (Germany) |
| AMA Conferences 2013 |
3.3 - Photometric Micro Measuring Sensor for Real-Time Water Analysis |
M. Argauer, A. Graf, M. Betz, A. Hutterer, M. Bauhuber, A. Lechner, H. Hummel - Hochschule Regensburg (Germany) |
| AMA Conferences 2013 |
4.1 - Intensity Referencing and Response Linearization in an Optical-Reflection-Based Distance Sensor System for White-Goods Applications |
J. Baumer, J. Schenkl - emz - Hanauer GmbH & Co KGaA, Nabburg (Germany), M. Shamonin - Regensburg University of Applied Sciences (Germany) |
