| SENSOR+TEST Conferences 2009 |
B8.2 - Three dimensional tactile-optical probing for the measurement of microparts |
R. Tutsch, M. Petz - Technische Universität Braunschweig, Braunschweig, Deutschland, M. Andraes, T. Wiedenhoefer - Werth Messtechnik GmbH, Gießen, Germany, U. Neuschaefer-Rube, M. Wissmann - Physikalisch-Technische Bundesanstalt, Braunschweig, Germany |
| SENSOR+TEST Conferences 2009 |
B8.3 - Multifunctional, Laserinterferometric Measurement Systems |
W. Schott, W. Poeschel, D. Dontsov - SIOS Meßtechnik GmbH, Ilmenau, Germany |
| SENSOR+TEST Conferences 2009 |
B8.4 - Optical 3D Measurement of Micro Structures |
A. Ettemeyer, M. Marxer, C. Keferstein - NTB Interstaatliche Hochschule für Technik Buchs, Buchs, Switzerland |
| SENSOR+TEST Conferences 2009 |
C4.1 - Wireless Automation |
G. Scholl - Helmut-Schmidt-Universität, Universität der Bundeswehr, Hamburg, Germany |
| SENSOR+TEST Conferences 2009 |
C4.2 - Energy efficient sensor nodes |
L. Binternagel - CompoTEK GmbH, München, Germany |
| SENSOR+TEST Conferences 2009 |
C4.3 - RFID and Wireless Sensing |
J. Essel, D. Brenk, R. Weigel - Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany |
| SENSOR+TEST Conferences 2009 |
C4.4 - Autonomous Cooperating Processes for the Improvement of Food Quality |
D. Hentschel, R. Jedermann, W. Lang - University of Bremen, Bremen, Germany |
| SENSOR+TEST Conferences 2009 |
C5.1 - Sensor Based RFID-Identification System |
J. Woellenstein, M. Bauersfeld, C. Peter - Fraunhofer-Institute for Physical Measurement Techniques, Freiburg, Germany, A. Oprea, U. Weimar - Institute for Physical and Theoretical Chemistry IPC, Tübingen, Germany, M. Schmidt - Scemtec Transponder Technology, Reichshof, Germany, T. Becker - EADS Deutschland GmbH, Ottobrunn, Germany, O. Kiesewetter - UST Umweltsensortechnik GmbH, Geschwenda, Germany |
| SENSOR+TEST Conferences 2009 |
C5.2 - EtherCAT - The new standard for measurement applications - Central backbone for distributed systems |
J. Kessel - ADDITIVE Soft- und Hardware für Technik und Wissenschaft GmbH, Friedrichsdorf, Germany |
| SENSOR+TEST Conferences 2009 |
C5.3 - Smart Passive Sensors with RFID Read-Out for Item Tagging |
M. Hoffmann, M. Schneider - Technische Universität Ilmenau, Ilmenau, Germany, G. Menges - NXP Semiconductors Germany GmbH, Hamburg, Germany, M. Werner - Alcan Packaging Singen GmbH, Singen, Germany |
