Available documents

Event	Title	Author(s)
SMSI 2023	D2.2 - Advanced Error Modelling of a Fourier Scatterometer	M. van Dijk, G. Kok - VSL - Narional Metrology Institute, Delft (Netherlands)
SMSI 2023	D2.3 - Modelling in Measurement - From classical analytical approaches to cognitive data-driven solutions -	N. Schiering - ZMK & ANALYTIK GmbH, Bitterfeld-Wolfen, (Germany), M. Heizmann - Karlsruhe Institute of Technology, Karlsruhe (Germany), W. Koch - Fraunhofer FKIE, Wachtberg (Germany), K. Sommer - Technische Universität Ilmenau, Ilmenau (Germany)
SMSI 2023	D2.4 - On Uncertainty Evaluation using Virtual Experiments	G. Wübbeler, M. Marschall, C. Elster - Physikalisch-Technische Bundesanstalt, Berlin (Germany)