2025 SMSI Bannerklein

P4 - Redundancy-orchestrated Information Fusion Exploiting Sensor Redundancy for Improved Model Robustness

Event
iCCC2024 - iCampµs Cottbus Conference
2024-05-14 - 2024-05-16
Cottbus
Band
Poster
Chapter
Condition Monitoring
Author(s)
C. Holst - inIT – Institut für industrielle Informationstechnik, Technische Hochschule Ostwestfalen-Lippe, Lemgo
Pages
131 - 131
DOI
10.5162/iCCC2024/P4
ISBN
978-3-910600-00-3
Price
free

Abstract

Sensor defects are a common occurrence in technical and industrial systems, manifesting as deviations in sensor measurements due to factors such as ageing, wear and tear, or environmental effects [1]. These defects introduce outliers, noise, offsets, or drift. Sensor defects significantly impact machine learning (ML) models, as data distributions increasingly deviate from the training data with the severity of the defect, making them out-of-distribution. Because ML models
are limited to the knowledge obtained from their training data, out-of-distribution data causes a decline in the accuracy of their predictions or classifications [1, 2]...

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