B6.3 - A Hybrid Approach Using Near-Field Scanning in Combination with Field Simulations
- Event
- ETTC 2024 - European Test and Telemetry Conference
2024-06-11 - 2024-06-13
Nuremberg - Chapter
- HIL & HTB - challenges and solutions
- Author(s)
- D. Schröder, C. Hedayat - Fraunhofer ENAS, Paderborn (Germany), A. Weiß, H. Kuhn - Fraunhofer ENAS, Chemnitz (Germany)
- Pages
- 248 - 253
- DOI
- 10.5162/ETTC2024/B6.3
- ISBN
- 978-3-910600-02-7
- Price
- free
Abstract
This contribution shows the principle of near-field scanning (NFS) used in combination with electromagnetic field simulations across various domains of applications including automotive, IoT and industrial). With a near-field scanner, the field probes capture the electric and magnetic field strength within a few milli- or centimeter distance to the device under test (DUT). One the one hand, the nearfield scanning results can be directly used in order to characterize and to investigate the DUT regarding functionality, security, electromagnetic compatibility (EMC), electromagnetic immunity (EMI) and field propagation characterization. On the other hand, using the so-called Huygens-principle, equivalent near-field sources of the DUT can be derived from near-field scans. These sources can then be imported into a field simulation tool to further post-process the NFS results. This hybrid approach can be used to extrapolate the near-field into the far-field at e.g. 3 meter or to evaluate the influence of the DUT on the environment and adjacent devices (cars, airplanes, humans, housing, others devices). It will be shown, that near-field scanning is a beneficial technique in every design phase of an electric component all along the way until its integration into the whole final system.