Available documents

Event	Title	Author(s)
ETTC 2024 - European Test and Telemetry Conference	B6.1 - HIL & HTB - challenges and solutions	J. Collrep, B. Judd, E. Goethert - United Electronic Industries., Norwood (USA)
ETTC 2024 - European Test and Telemetry Conference	B6.3 - A Hybrid Approach Using Near-Field Scanning in Combination with Field Simulations	D. Schröder, C. Hedayat - Fraunhofer ENAS, Paderborn (Germany), A. Weiß, H. Kuhn - Fraunhofer ENAS, Chemnitz (Germany)