A2 - Reflection Method of Reading Acoustoelectronic Sensors Parameters
- Event
- 20th Jubilee Winter Workshop
on Acoustoelectronics
2024-02-24 - 2024-02-27
Szczyrk, Beskidy Mountains (Poland) - Chapter
- Acoustoelectronics
- Author(s)
- M. Grabka, K. Jasek, M. Pasternak - Military University of Technology, Warsaw
(Poland) - Pages
- 8 - 9
- DOI
- 10.5162/20WWonAE/A2
- ISBN
- 978-3-910600-05-8
- Price
- free
Abstract
The acoustoelectronic sensos change their resonant parameters under influence of the environmental conditions. Usually, the parameters are measured in the self-oscillating circuits or, less frequently, in the systems with an external sweeping generator. Both methods analyze the signal transmitted through the sensor. The development of modern miniaturized digital systems creates the possibility to apply another measurement method: reflectometry. This method uses signal reflection phenomena from input impedance of the device. The numerous measurements of the quartz crystal microbalances and surface acoustic wave sensors show that the reflectometry is not only applicable to the sensors but also offers some advantages compared to habitual methods. The paper describes a reflection measurement result obtained with miniaturized vector network analyzer.