| SENSOR+TEST Conferences 2009 |
OP4 - Multi Wavelength Interferometry for High Precision Distance Measurement |
J. Petter - Luphos GmbH, Darmstadt, Germany |
| SENSOR+TEST Conferences 2009 |
OP5 - A 3D-Fourier-Descriptor Approach to Compress and Classify 3D Imaging Data |
R. Schmitt, P. Fritz - RWTH Aachen University, Aachen, Germany |
| SENSOR+TEST Conferences 2009 |
OP6 - Quality Assurance of Grain with Colour Line Scan Cameras |
P. Brueckner, K. Anding, H. Weissensee, M. Dambon - Technische Universität Ilmenau, Ilmenau, Germany |
| SENSOR+TEST Conferences 2009 |
OP7 - The Design of Calibration Equipment for Dynamic Loading of Optoelectronic Six-Component Force-Torque Sensor |
M. Kvasnica - University Zlin, Zlin, Czech Republic |
| SENSOR+TEST Conferences 2009 |
OP8 - Determination of Patulin Toxicity and its Control in Environment by Optical Biosensor Systems |
N. Starodub - National University of Life and Environmental Science of Ukraine, Kiev, Ukraine, A. Katsev - Crimean State Medical University, Odessa, Ukraine, L. Pylipenko, I. Pylipenko - National Academy of Foods Technology, Odessa, Ukraine, A. Nabok - Sheffield Halam University, Sheffiled, Great Britain |
| SENSOR+TEST Conferences 2009 |
OP9 - An integrated optical scheme for interrogation of interferometric fiber optic sensors |
A. Kozlov, I. Ilichev, A. Shamray - Ioffe Physico-Technical Institute, St. Petersburg, Russia |
| SENSOR+TEST Conferences 2009 |
OP10 - Interference Measurement of Rough Surface Relief |
O. Angelsky, O. Maksimyak, P. Maksimyak - Chemivtsy University, Chemivtsy, Ukraine |
| SENSOR+TEST Conferences 2009 |
OP11 - About the Peculiarities of Using the Optical Bistability Phenomenon in Measuring Systems |
C. Zenkova - Chemivtsy University, Chemivtsy, Ukraine |
| SENSOR+TEST Conferences 2009 |
OP12 - About the Peculiarities of the Polarization Approach to the Measuring of Coherence Properties of Optical Field |
C. Zenkova, O. Angelsky, N. Gorodyns'ka - Chemivtsy University, Chemivtsy, Ukraine |
| SENSOR+TEST Conferences 2009 |
OP13 - 3D-Terahertz-Tomography for Material Inspection and Security |
T. Loeffler - SynView GmbH, Glashütten, Germany |
