D5.4 - Compressed Sensing Time Resolved Photoluminescence Imaging for Semiconductor Characterisation
- Event
- SMSI 2023
2023-05-08 - 2023-05-11
Nürnberg - Band
- Lectures
- Chapter
- D5 - Metrology of compound semiconductors for manufacturing power electronics
- Author(s)
- A. Baltusis, G. Koutsourakis, S. Wood, S. Sweeney - University of Surrey, Guildford (United Kingdom)
- Pages
- 237 - 238
- DOI
- 10.5162/SMSI2023/D5.4
- ISBN
- 978-3-9819376-8-8
- Price
- free
Abstract
Compressed sensing has been applied to time-resolved photoluminescence measurements for semiconductor device and material characterisation. This novel approach has the potential to achieve charge carrier lifetime imaging of semiconductor samples with shorter measurement times, higher repeatability and increased signal to noise ratio. The feasibility of the approach is investigated through simulations and an order of magnitude improvement in measurement acquisition speed over scanning approaches is demonstrated in this work. A proof-of-concept experimental system is presented, with initial measurements confirming the feasibility of this method.